Real-Time, Speckle-Free, Laser Line Analysis

Advanced optical alignment platform with real-time, high resolution, speckle-free, laser line analysis and optical anomaly detection.

Purpose

Advances in machine vision and 3D scanning have raised the bar for laser-based inspection systems. Where once basic illumination was sufficient, today’s applications demand high-performance laser lines with exceptional intensity uniformity, tightly controlled line thickness, well-defined cross-sectional profiles, and free of “secondary” optical anomalies. Advanced manufacturing capabilities are required to repeatably produce such laser sources at scale.

Our Approach

Meeting the manufacturing demand for high-performance laser lines free of undesirable secondary artifacts, Diode Laser Concepts has developed a novel optical metrology system providing Real-Time, Speckle-Free, Laser Line Analysis in production for mid-process product analysis. During alignment of optical elements, this inspection technology provides real-time acquisition and high-resolution display of critical optical parameters, ensuring the most demanding specifications are repeatably met.

Technology & Process

• High resolution, real-time, camera-based analysis of the full line length.
• Proprietary speckle-free imaging for resolving faint anomalies.
• Autofocusing (“liquid”) camera lens for optimum focus at multiple field distances.
• Simultaneous direct beam profile measurements for accurate line thickness control.
• CDRH/IEC radial power measurements for laser classification.
• Custom designed opto-mechanics for micro-positioning of optical elements.
• Real-time acquisition of critical parameters during optical element positioning.
• Custom GUI with analysis of optical parameters relative to product pass/fail criteria.

 

Applications

• Demanding machine vision and industrial inspection.
• High performance 3D scanning.
• Biomedical imaging and diagnostics.
• Custom OEM photonics systems.